Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography

Krzysztof Kulawik; Adam Kruk; Beata Dubiel; Aleksandra Czyrska-Filemonowicz

doi:10.4028/www.scientific.net/SSP.186.45

Paper Titles

A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food Supplements
p.28

Physical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy
p.32

3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography
p.37

3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography
p.41

Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography
p.45

Martensitic Transformation in Ti₅₀Ni₂₅Cu₂₅ Shape Memory Alloy Studied by EBSD
p.49

Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope
p.53

Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM
p.58

High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks
p.62

HomeSolid State PhenomenaSolid State Phenomena Vol. 186Three-Dimensional Visualization and Metrology of...

Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography

Abstract:

In the present work a quantitative analysis of γ' and γ" phase nanoparticles in Inconel 718 was performed using two methods of electron tomography, namely EFTEM and FIB tomography. 3D visualisation showed that γ' particles are spherical, while γ" precipitates are disc-shaped. The values of mean size of γ' and γ" phase particles, determined by both electron tomography methods applied, are in good agreement.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Solid State Phenomena (Volume 186)

Pages:

45-48

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.186.45

Citation:

Cite this paper

Online since:

March 2012

Authors:

Krzysztof Kulawik, Adam Kruk, Beata Dubiel, Aleksandra Czyrska-Filemonowicz

Keywords:

Electron Tomography, FIB Tomography, Inconel 718, Nanoparticle

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] B. Dubiel, A. Kruk, E. Stępniowska, G. Cempura, D. Geiger, P. Formanek, J.C. Hernandez, P.A. Midgley, A. Czyrska-Filemonowicz: J. Microscopy 236 (2009)149–157.

DOI: 10.1111/j.1365-2818.2009.03283.x

Google Scholar

[2] A. Kruk, B. Dubiel, W. Osuch, G. Cempura, A. Czyrska-Filemonowicz: Inżynieria Materiałowa 74 (2010)86-93, in Polish.

Google Scholar

[3] R.M. Langford: Microscopy Research and Technique 69(2006)538–549.

Google Scholar

[4] M. Weyland, P. A. Midgley, R. Brydson, A.R. Lupini, S.N. Rashkeev, M. Varela, A.Y. Borisevich, M.P. Oxley, K. van Benthem, Y. Peng, N. de Jonge, G.M. Veith, S.T. Pantelides, M.F. Chisholm, S.J. Pennycook, R.E. Dunin–Borkowski, T. Kasama, R.J. Harrison, D. J. Smith, P.L. Gai, M. R. Caste.: Nanocharacterisation, Nanocharacterisation, Chapter 6, Electron Tomography, 2007, 184-267.

DOI: 10.1039/9781847557926-00028

Google Scholar